The Chicago Chapter
of the American Statistical Association is pleased to announce
William Q. Meeker as the 2006 Statistician of the Year. The
Chapter’s Statistician of the Year is selected by a vote of past
honorees, all of whom are internationally renowned members of
the statistical community. Selection as a Chicago Chapter
Statistician of the Year is a very significant honor.
Please help us
welcome William Meeker into this select community at our Chapter
dinner, November 14, 2006, at the Eastbank Club, at which he
will accept the award and make a presentation to the Chapter on
“Reliability Data Analysis Examples.”
William Meeker is a
Professor of Statistics and Distinguished Professor of Liberal
Arts and Sciences at Iowa State University. He is a Fellow of
the American Statistical Association, an elected member of the
International Statistical Institute, and a past Editor of
Technometrics. He is co-author of the books Statistical Methods
for Reliability Data with Luis Escobar (1998), and Statistical
Intervals: A Guide for Practitioners with Gerald Hahn (1991),
four book chapters, and of numerous publications in the
engineering and statistical literature. He and his co-authors
have won the American Society for Quality (ASQ) Youden prize
four times and the ASQ Wilcoxon Prize three times. In 2001, he
and his co-author were recognized by the American Statistical
Association for the Best Practical Application Award. He has
consulted extensively on problems in reliability data analysis,
reliability test planning, accelerated testing, nondestructive
evaluation, and statistical computing.
Reliability
assurance processes in manufacturing industries require
data-driven information for making product-development
decisions. Life tests, accelerated life tests, and accelerated
degradation tests are commonly used to collect reliability data.
Data from products in the field provide another important source
of useful reliability information. Due to complications like
censoring, these reliability studies typically yield data that
require special statistical methods. This presentation will
describe graphical outputs of the analyses of five different
applications in the area of product reliability. Methods used in
the analyses include Weibull and lognormal analysis, analysis of
data with multiple failure modes, and the analysis of
accelerated test data.
The dinner will be
held at the Eastbank Club, 500 N Kingsbury, Chicago.
Registration will begin at 6 p.m.; dinner will be served at 6:30
p.m. To make reservations, please complete the form below and
mail with payment as directed. The cost of the dinner is $55
for ASA Chicago Chapter members and $60 for non-members.
Students who want to
attend the dinner, but who have limited financial resources may
apply for a Lucille Derrick fund subsidy of their registration
fee. Please contact Jerry Enenstein if you would like to file
for the student subsidy.
Click to download the registration form